Scanning Electron Microscopy
Moody Labs’ Material Testing Laboratory has been offering particle analysis and materials characterization from our Dallas, Texas laboratory for over 30 years. These services find applications across a wide variety of fields including:
- Semiconductor
- Industrial / Production
- Medical Device
- Pharmaceutical
- Environmental
- Quality Control
- Industrial Hygiene
- Geology / Mineralogy
SEM/EDXA:
Scanning Electron Microscopy at Moody Labs provides high resolution digital imaging of materials and particles at magnifications up to 500,000 times using our high resolution Hitachi Field Emission SEM. Striking digital images with incredible depth of field easily reveal the detail and surface structure of your sample. Precise measurements can be performed on the features or particles being observed.
Energy Dispersive X-ray Analysis (EDXA) provides chemical compositional information of metals, materials, or individual particles. It can even generate compositional maps by analyzing the x-rays emitted by the sample while it’s being examined in the SEM. This is accomplished using our state-of-the-art Noran System 7 X-ray analyzer coupled with a solid state SDD detector.
We have years of experience utilizing these tools in a wide variety of applications including:
- Contaminants and foreign object identification
- Metals analysis, alloy identification, corrosion analysis
- Failure Analysis
- Plating Analysis
- Powder / particle analysis, sizing, dimensional analysis
- Compositional distribution imaging (x-ray mapping)
- Mineral analysis and identification.
- Paint and coating analysis including thickness measurements.
- Product evaluation and testing.
- Incoming materials quality testing.
Our analysis includes a comprehensive test report tailored to the specific requirements of your project and will include chemical composition analysis data, high magnification images, and interpretations based on our experience and observations.
Every application is unique, call or email us for a free consultation.
